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Optical workshop inspection (third edition of the original book)

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Optical workshop inspection (third edition of the original book)
Publication time: 2012 Content introduction "International Mechanical Engineering Advanced Technology Translation Series: Optical Workshop Inspection (3rd Edition of the original book)" is one of the authoritative works in the field of optical inspection, the first edition to the third edition of the reprint lasted three For ten years, the first edition was well received by readers in the field of optical inspection. This book (3rd edition of the original book) details the various instruments, methods and technical means in the field of optical detection, as well as the latest important progress in the field of optical detection in the past three decades. "International Mechanical Engineering Advanced Technology Translation Series: Optical Workshop Inspection (3rd Edition of the Original Book)" is divided into 18 chapters. The main contents include: Newton Interferometer, Fizeau Interferometer, Heidinger Interferometer, and Taman Green Interferometer. Common optical path interferometer, transverse shear interferometer, radial, rotary and reverse shear interferometer, multi-beam interferometer and multi-channel interferometer technology principles and use methods; introduced Foucault knife-edge method, filament method Phase modulation method, Runge test, Hartmann diaphragm test, Hartmann-Sharker diaphragm test and other diaphragm tests, star test, aspheric wavefront and mirror test, Zernike polynomial and wavefront Fitting, phase shift interferometry, surface profiler, multi-wavelength and white light interferometry, optical detection of scattering surface, measurement of angle, prism, curvature radius and focal length, mathematical description of optical surface and its characteristics, etc. And analytical methods. This book can be used as a reference for the majority of scientific and technical personnel engaged in optical inspection, testing, testing, metrology and research, design and manufacturing, and can also be used as teaching materials for related professional students and teachers.
Contents Preface to the 3rd Edition Translator's Words 3rd Edition Preface Chapter 1 Newton Interferometer, Fizeau Interferometer, and Heidinger Interferometer
1.1 Introduction
1.2 Newton Interferometer
1.2.1 Consideration of Light Source Size
1.2.2 Several suitable light sources
1.2.3 Materials for making flat samples
1.2.4 Simple method for estimating maximum error
1.2.5 Spherical measurement
1.2.6 Aspheric surface measurement
1.2.7 Flatness measurement of opaque surfaces
1.3 Fizeau interferometer
1.3.1 Basic Fizeau Interferometer
1.3.2 Light source coherence requirements
1.3.3 Quality requirements for collimating lenses
1.3.4 Liquid datum
1.3.5 Fizeau interferometer with laser as light source
1.3.6 Multibeam Fizeau Interferometer
1.3.7 Measurement of approximately parallel plates
1.3.8 Detection of heterogeneity of large-mouth glass and fused silica samples
1.3.9 Measuring the parallelism and flatness of rods, blocks and flat surfaces
1.3.10 Three-sided right-angle prism and right-angle prism measurement
1.3.11 Fizeau interferometer detection of curved surfaces
1.3.12 Detection of concave and convex surfaces
1.4 Heidinger interferometer
1.4.1 Application of Heidinger Interferometer
1.4.2 Using a laser as a light source for the Heidinger interferometer
1.4.3 Other applications of Heidinger interferometer
1.5 References for Absolute Measurement of Planes Chapter 2. Taman-Green Interferometer
2.1 Introduction
2.2 Beamsplitter
2.2.1 Optical path difference caused by a spectroscope plate
2.2.2 Precision requirements of flat beam splitters
2.2.3 Polarizing Beamsplitters
2.2.4 Non-polarizing Beamsplitters
2.3 Coherence requirements
2.3.1 Spatial coherence
2.3.2 Time coherence
2.4 Application of Taman Green Interferometer
2.4.1 Detection of prisms and diffraction gratings
2.4.2 Detection of the lens
2.4.3 Inspection of Micro Objectives
2.5 Compensation for internal distortion of the interferometer
2.6 Unequal Interferometer
2.6.1 Several special designs
2.6.2 Improve stripe stability
2.7 Open Optical Interferometer
2.7.1 Mach Zed Interferometer
2.7.2 oblique incidence interferometer
2.8 Deformation of Tyman Green's Light Structure
2.8.1 Multi-frame imaging interferometer
2.8.2 Interferometer using a diffractive beamsplitter
2.8.3 Phase Conjugate Interferometer
2.9 Taman Green Interferogram and Analysis References Chapter 3 Common Optical Interferometer
3.1 Introduction
3.2 Birch interferometer using two matched scattering plates
3.2.1 Fresnel zone plate interferometer
3.2.2 Birch and Fresnel Zone Interferometer Detection of Aspheric Surfaces
3.2.3 Birch and Fresnel zone plate interferometer to measure phase shift
3.3 Birefringent Beamsplitters
3.3.1 Sava Polarizer
3.3.2 Wollaston prism
3.3.3 Bifocal system
3.4 Transverse Shear Interferometer
3.4.1 Use of Sava Polarizers
3.4.2 Use of Wollaston prism
3.5 Bifocal Interferometer
3.6 Sanders prism interferometer
3.7 Point diffraction interferometer
3.8 Zernike Detection References Using a Common Optical Interferometer
4.1 Introduction
4.2 Coherence of the light source
4.3 Introduction to the theory of transverse shear interferometry
4.3.1 Spherical and plane wavefront interference patterns
4.3.2 Interference pattern of primary aberrations in transverse shear interference
4.4 Estimation of unknown wavefront
4.5 Parallel light transverse shear interferometer (white light compensation)
4.5.1 Transverse shear interference device based on Jamin interferometer
4.5.2 Transverse shear interference device based on Michelson interferometer
4.5.3 Lateral shearing device based on cyclic interferometer
4.5.4 Transverse Shearing Device Based on Mach Zed Interferometer
4.6 Converging light transverse shear interferometer (white light compensation)
4.6.1 Transverse shear device based on Michelson interferometer
4.6.2 Transverse shearing device based on Mach-Zehnder interferometer
4.7 Transverse shear interferometer using laser
4.8 Other types of transverse shear interferometers
4.8.1 Transverse Shear Interferometer Based on Diffraction Principle
4.8.2 Transverse Shear Interferometer Based on the Principle of Polarization
4.9 Vector Shear Interferometer
4.9.1 Shear Interferometry
4.9.2 Directional Shear Interferometer
4.9.3 Simulated interference pattern
4.9.4 Experimental results
4.9.5 Similarities and Differences between Vector Shear Interferometers and Other InterferometersReferencesChapter 5 Radial, Rotating and Inverse Shear Interferometer
5.1 Introduction
5.2 Radial Shear Interferometer
5.2.1 Wavefront evaluation of radial shear interference pattern
5.2.2 Single optical path radial shear interferometer
5.2.3 Double optical path radial shear interferometer
5.2.4 Laser Radial Shearing Interferometer
5.2.5 Thick lens radial shear interferometer
5.3 Rotating Shear Interferometer
5.3.1 Rotating Shear Interferometer with Uncompensated Light Source Size
5.3.2 Rotating Shear Interferometer with Light Source Compensation
5.4 Inverse Shear Interferometer ReferencesChapter 6 Multibeam Interferometer
6.1 A Brief History of Development
6.2 Accuracy of multi-beam interferometry
6.3 Multibeam Fizeau Interferometer
6.3.1 Formation of interference fringes
6.3.2 Fizeau Interferometry
6.4 Isochromatic order stripes
6.5 How to reduce the interval of interference fringes in multi-beam interferometry
6.6 Parallel plane Fabry-Perot interferometer
6.6.1 Measurement of film thickness
6.6.2 Surface flatness deviation
6.7 Tolanski interference fringes produced by the Bury Perot interferometer
6.8 Multibeam Interferometer for Surface Inspection
6.9 Coupling Interferometers and Tandem Interferometers
6.9.1 Coupling Interferometer
6.9.2 Tandem Interferometer
6.10 Holographic Multibeam Interferometer
6.11 The recent development of Fabry Perot interference fringes ...
Chapter 7 Multi-channel interferometer Chapter 8 Foucault knife-edge method, filament method and phase modulation method Chapter 9 Ronclu test method Chapter 10 Hartmann diaphragm test, Hartmann-Sharker diaphragm test and others Aperture Inspection Chapter 11 Star Point Test Chapter 12 Aspheric Wavefront and Mirror Inspection Chapter 13 Zernike Polynomials and Wavefront Fitting Chapter 14 Phase Shift Interferometry Chapter 15 Surface Profiler, Multiwavelength and White Light Interferometry Chapter 16 Optical Inspection of Scattering Surfaces Chapter 17 Measurement of Angles, Prisms, Curvature Radius and Focal Length Chapter 18 Mathematical Description of Optical Surfaces and Their Characteristics

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